New PDF release: [Dissertation] An Integrated System-Level Design for

By Erik Larsson

ISBN-10: 9172198907

ISBN-13: 9789172198906

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Additional resources for [Dissertation] An Integrated System-Level Design for Testability Methodology

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Assign values to ni where 0

7(a) a line (wire) between two components is shown. The ability to set the value of the line (wire) to 0 is enhanced by adding a 0-controllability test point. 7(b). 7(c). 7(d). The main advantage of test point insertion is that the technique can be applied to any line in the design. However, the drawback is the large demand for extra primary inputs and outputs. The technique also requires extra gates and extra lines which introduce additional delay. Scan Technique The main problem for test pattern generation is usually due to the sequential parts of the design.

By testing the blocks in sequence, block1 followed by block2, the total test time is: Ta=(f1+f2)×p+(f1+f2) × p2+1=11251; where +1 refers to the fact that the last test pattern is shifted out while no new pattern is shifted in. The approach is very inefficient and by arranging the test patterns in such way that both scan-chains 1 and 2 are seen as a single scan-chain the test application time can be reduced to: Tb=(f1+f2)×max(p1,p2)+1=7501. A bypass structure such as the TestShell can be introduced to further minimize the test application time.

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[Dissertation] An Integrated System-Level Design for Testability Methodology by Erik Larsson

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